Invited Speakers

Patrik Vagovič, CFEL, DESY (Germany) – Session “New Instrumentation”
Oleg Gorobtsov, University of Tübingen (Germany) – Session “Coherent Far-Field Imaging and Applications (CDI, Ptychography, …)”
Ivan Zaluzhnyy, University of Tübingen (Germany) – Session “Reciprocal Space Imaging and Applications (HR-XRD, XR, GISAXS, GID, ...)”
Saša Bajt, CFEL, DESY (Germany) – Session “X-Ray Microscopy (TXM, STXM, …) and Related Optics”
Marina Eckermann, University of Bern (Switzerland) – Session “Phase-Contrast Imaging and Applications”
Mark Goorsky, University of California (USA) – Session “Diffraction-Contrast Imaging and Applications (Topography, RCI, DF-XRM, …)”
Christian Schlepütz, PSI (Switzerland) – Session “High-Throughput, In Situ, Operando and In Vivo Methods and Applications”
Yuhe Zhang, Lund University (Sweden) – Session “Theory, Algorithms, Computing and AI-Based Approaches”
Jeremiah McCallister, Bruker (UK) – Session “Applied and Industrial Research”
Sharon Shwartz, Bar-Ilan University (Israel) – Session “Related Techniques

Vincent Favre-Nicolin, ESRF (France) - Coherent X-ray imaging and ptychography techniques
Stefan Kowarik, University of Graz (Austria) - X-ray scattering by nanostructures
Julia Villanova, ESRF (France) - X-ray microscopy techniques
Julia Herzen, University of Munich (Germany) - Phase-contrast and dark-field imaging
Tobias Schülli, ESRF (France) - X-ray diffraction imaging techniques