XTOP 2026
16th Conference on High-Resolution X-ray Diffraction and Imaging
21–25 September 2026, Karlsruhe, Germany
XTOP 2026 brings together scientists working in X-ray diffractometry and reflectometry, coherent and conventional X-ray diffraction imaging and topography, as well as 2D and 3D X-ray imaging using phase contrast and complementary contrast mechanisms. The conference is a leading forum for laboratory- and synchrotron-based methods, instrumentation, and applications.
Scientific Topics
X-ray imaging, diffraction and scattering methods:
- Near-field 2D imaging and 3D tomography methods with various contrasts, such as absorption, phase, extinction, diffraction (e.g. topography), dark-field, and others
- Far-field methods, such as X-ray reflectivity (XR), grazing incidence diffraction (GID), grazing incidence small-angle scattering (GISAXS), high-resolution diffraction (HR-XRD), nano diffraction, coherent diffraction imaging (CDI), ptychography, and others
- X-ray microscopy, such as full-field transmission microscopy (TXM), scanning microscopy (STXM), dark-field microscopy (DF-XRM), and others
- Related techniques, such as standing wave methods, quantum imaging, Compton microscopy
Related topics:
- Theory and algorithms, such as near field and far field image formation, phase retrieval, volume reconstruction, kinematical / DWBA / dynamical diffraction approaches, diffuse scattering approaches, and others
- Computing and AI approaches for simulations, statistical analysis, volume segmentation, high-throughput computing, and others
- Instrumentation, such as new beamlines and experimental stations, new possibilities by improved sources, optics, detectors, sample environments and others
- High-throughput, in situ, operando, in vivo approaches
- Crystal defects: theory and experiment
- Scientific applications in materials research, nano-sciences, life sciences, natural and cultural heritage, and other fields
- Industrial applications
- Bio-medical applications
